专用集成电路与系统国家重点实验室
系列讲座之四

题  目:FPGA-based Techniques to Characterize, Address and Exploit Process Variation
报告人:Philip Heng Wai Leong (University of Sydney)
时  间:2012年4月11日(周三)下午3:30-4:30
地  点:张江校区微电子楼369

Abstract
As semiconductor manufacturing continues towards reduced feature sizes, process variation becomes increasingly important. In this talk, the following three examples of how reconfigurability in FPGAs can be used to characterize, address and exploit some associated issues will be presented:
(1) A differential technique that can be used to accurately characterize individual FPGA chips by measuring logic element and interconnect delay.
(2) Symmetric FPGA architectures which allow mapping of a circuit into multiple equivalent implementations with nominally equivalent delay to improve yield.
(3) A circuit which advantageously utilizes process variation to generate chip-specific identifiers.

Biography
Philip Leong received the B.Sc., B.E. and Ph.D. degrees from the University of Sydney. In 1993 he was a consultant to ST Microelectronics in Milan, Italy working on advanced flash memory-based integrated circuit design. From 1997-2009 he was with the Chinese University of Hong Kong. He is currently an Associate Professor in the School of Electrical and Information Engineering at the University of Sydney, a Visiting Professor at Imperial College, London and the Chief Technology Consultant to Cluster Technology.
He was the co-founder and program co-chair of the International Conference on Field Programmable Technology (FPT); program co-chair of the International Conference on Field Programmable Logic and Applications (FPL) and is an associate editor for the ACM Transactions on Reconfigurable Technology and Systems. The author of more than 100 technical papers and 4 patents, Dr. Leong was the recipient of the 2005 FPT conference Best Paper as well as the 2007 and 2008 FPL conference Stamatis Vassiliadis Outstanding Paper awards.

 
 
 
 

 

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