专用集成电路与系统国家重点实验室
系列讲座之一

题  目:IC Compiler Fatal Hunt
报告人:Dr. Shir-Shen Chang (R&D Group Director at Synopsys)
时  间:2012年3月13日周二下午15:00-15:45
地  点:张江校区微电子楼369室

Abstract
Quality and stability is as important as functionality and performance in commercial software product. It is a hard and never ending battle for developers to maintain a certain level of quality and stability of the software after code changes. It is especially true for the most complex EDA software in the world---IC Compiler. This presentation describes a real life event of the IC Compiler R&D team’s attack on this issue. Process changes and metrics driving are utilized to align development discipline. A novel testing methodology, Pseudo-random Testing, is introduced to efficiently improve software usage flow robustness. A brief result and summary are also given at the end.

Biography
Shir-Shen is an R&D Group Director at Synopsys. He has studied EDA since 1983, and took an EDA R&D career since 1989. Shir-Shen worked on various digital IC implementation EDA products over the last 22 years. Currently, among other interests in Low Power design, 3D-IC, etc., Shir-Shen’s spends a lot of time focusing on the complex software quality and stability improvement. Shir-Shen received a Ph.D. in Electrical Engineering from Rensselaer Polytechnic Institute at Troy, New York in 1989.

 
 
 
 

 

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