讲座信息

Advanced modeling and analysis techniques for nanometer
interconnect and multi-core VLSI circuits

July 28 to Aug. 1, 2008

Seminar series and discussions for
Microelectronic Dept. Fudan University

Prof. Sheldon X-.D. Tan (谭向东)
stan@ee.ucr.edu

Department of Electrical Engineering
University of California at Riverside

http://www.ee.ucr.edu/~stan

 

时间:7月28日-7月31日 下午1:30-3:00
地点:张江校区微电子楼369会议室

 

July 28, Monday

Robust VLSI on-chip power delivery and verification: challenges and solutions

July 29, Tuesday,

Advanced compact interconnect modeling and reduction technique for VLSI design

July 30, Wednesday

Architecture level thermal, power, analysis for dynamic thermal management, Spin-torque transfer RAM (SPRAM), SPRAM-based FPGA design.

July 31, Thursday

Symbolic circuit analysis and hierarchical reduction and statistical interconnect analysis and modeling

 
 
 
 

 

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