学术报告

 

题  目:Robust Electrostatic Discharge (ESD) Protection in CMOS Technology

报告人Professor Juin J. Liou

Dept. of Electrical and Computer Engineering

Director, Solid State Electronics Lab and Device Characterization Lab

University of Central Florida, Orlando, Florida, USA

时间 :2006年68下午3:30

地点 :微电子楼 B-213 ( 邯郸校区 )

 

Abstract Electrostatic discharge (ESD) is a process in which a finite amount of charge is transferred from one object (i.e., human body) to the other (i.e., microchip). This process can result in a very high current passing through the microchip within a very short period of time, and more than 35% of chip damages can be attributed to such an event.  As such, designing robust on-chip ESD structures to protect microchips against ESD stress is a high priority in the semiconductor industry. An overview on the ESD sources, models, and protection solutions will first be given in this talk. This is followed by the development of a compact yet accurate MOS model suitable for SPICE circuit simulation for the ESD event. Finally, a robust ESD protection solution for data communication transceivers will be presented.

 

 

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About the speaker:

Juin J. Liou received the B.S. (honors), M.S., and Ph.D. degrees in electrical engineering from the University of Florida, Gainesville, in 1982, 1983, and 1987, respectively. In 1987, he joined the Department of Electrical and Computer Engineering at the University of Central Florida, Orlando, where he is now a Professor. His current research interests are micro/nanoelectronics computer-aided design, RF device modeling and simulation, and semiconductor manufacturing and reliability.

Dr. Liou has filed 3 patents and published 6 textbooks (another in progress), more than 200 journal papers (including 14 invited articles), and more than 150 papers (including 50 keynote or invited papers) in international and national conference proceedings.  He has been awarded more than $6.5 million of research contracts and grants and has held consulting positions with research laboratories and companies in the United States, Japan, Taiwan, and Singapore .  In addition, Dr. Liou serves as a technical reviewer for various journals and publishers, chair or member of the technical program committee for several international conferences, and regional editor (in USA, Canada and South America ) for the Microelectronics Reliability, an international journal published by Elsevier Science.

Dr. Liou received ten different awards on excellence in teaching and research from the University of Central Florida and six different awards from the IEEE Electron Device Society. Among them, he was awarded the UCF Distinguished Researcher Award three times (1992, 1998, 2002), UCF Research Incentive Award two times (2000, 2005), and IEEE Joseph M. Biedenbach Outstanding Educator Award in 2004 for his exemplary teaching, research, and international collaboration. His other honors include Fellow of the IEE, Cao Guang-Biao Endowed Professor of Zhejiang University, China, Consultant Professor of Huazhong University of Science and Technology, Wuhan, China, Courtesy Professor of South China University of Technology, Guangzhou, China , IEEE EDS (Electron Device Society) Distinguished Lecturer, and National Science Council Distinguished Lecturer.

Dr. Liou is the IEEE EDS Treasurer, Chair of the IEEE EDS Finance Committee, Vice-Chair of the IEEE EDS Regions/Chapters Committee, member of the IEEE EDS Administrative Committee, member of the IEEE EDS Educational Activities Committee, member of the IEEE EDS Ex-Officio Administrative Committee, and senior member of the IEEE.

 
 

 

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