朱恒亮,男,1982年8月出生,博士。2004年7月毕业于中国科学技术大学电子工程与信息科学系,获工学学士学位。2004-2009年就读复旦大学微电子系,于2009年6月毕业获博士学位,留校任讲师。曾于2008年7月至9月访问美国Cadence公司伯克利研究实验室,曾于2009年1月至2月访问美国北卡罗莱纳州大学夏洛特分校数学与统计系,在Design Automation & Test in Europe、Design Automation Conference等国际会议与期刊上发表论文多篇。

研究方向
集成电路建模与仿真分析中的数值方法与算法,纳米工艺集成电路下的可制造性驱动设计问题,包括参数偏差驱动的参数提取、带参数模型降阶、统计的静态时序分析等。

代表性论文
[1] Henglinag Zhu, Xuan Zeng, Wei Cai, Jintao Xue, Dian Zhou, ”A Sparse Grid based Spectral Stochastic Collocation Method for Variations-Aware Capacitance Extraction of Interconnects under Nanometer Process Technology”, IEEE/ACM Design, Automation & Test in Europe Conference DATE’2007, pp. 1-6, April, 2007, Nice France.
[2]Henglinag Zhu, Xuan Zeng, Xu Luo,Wei Cai, ”Generalized Stochastic CollocationMethod for Variation-Aware Capacitance Extraction of Interconnects Considering Arbitrary Random Probability”, IEICE Trans. Electron., Special Section on Low-Leakage, Low-Voltage, Low-Power and High-Speed Technologies for System LSIs, to be published.
[3] Xuan Zeng, Henglinag Zhu, Fan Yang, Jun Tao, Yi Wang and Jintao Xue, ”Mathematical Problems in System-on-Chip Design and Manufacture”, Chapter 10 of book Some Topics in Industrial and Applied Mathematics, Editors: Tatsien Li and Pingwen Zhang, Higher Education Press & World Scientific Publishing Co., Jan. 2009.
[4] Yinghai Lu, Li Shang, Hai Zhou, Hengliang Zhu, Fan Yang and Xuan Zeng, “Statistical Reliability Analysis Under Process Variation and Aging Effects”, Design Automation Conference, Jul. 2009.

特邀报告
[1] “A Spectral Stochastic CollocationMethod for Capacitance Extraction of Interconnects with Geometric Variations”, IEEE Asia Pacific Conference on Circuits and Systems (APCCAS), Singapore, 2006.
[2] “Modeling of Interconnects with Stochastic Geometric Variations,” 7th International Conference on Spectral and High-Order Methods, June 2007.

 
 
 
 

 

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