陶俊
职称:副教授(硕士生导师)
办公地址:微电子楼317室
电话:021-51355381
E-mail:taojun@fudan.edu.cn
个人网页:http://homepage.fudan.edu.cn/taojun/

 

个人简介:
复旦大学微电子学院副教授,IEEE高级会员。主要研究方向为集成电路计算机辅助设计,包括统计数据分析及系统优化等。已在本领域的权威国际期刊和会议IEEE Trans. on CAD、IEEE Trans. on VLSI、DAC、ICCAD等上发表论文40余篇。多次承担/参与国家自然科学基金、国家十一五/十二五科技重大专项等。目前担任IEEE Technical Committee on Very Large Scale Integration (TCVLSI) Newsletter副主编,国际学术会议IEEE ASPDAC 2019, DVCon China 2018-2019、ICCD 2012、TAU 2011等技术委员会成员,以及国际学术期刊IEEE Trans. on CAD、IEEE Trans. on VLSI、ACM Trans. on DAES,国际会议DAC、ICCAD等审稿人。

研究方向:
·统计数据分析
·混合信号系统优化
·集成电路自动化设计
·生物芯片设计与测试

教育及学术经历:
2016-今 复旦大学微电子学院副教授
2012-2013 美国卡内基梅隆大学电子计算机工程系访问学者
2008-2015 复旦大学微电子学院讲师
2007 复旦大学微电子学系博士

学术任职:
1. IEEE Senior Member (IEEE高级会员)
2. IEEE Council on Electronic Design Automation (CEDA) 上海分会主席

代表论文:
1. Jun Tao, Yangfeng Su, Dian Zhou, Xuan Zeng and Xin Li, “Graph-Constrained Sparse Performance Modeling for Analog Circuit Optimization via SDP Relaxation,” IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), 2018.
2. Xiaoxue Sun, Chenyang Kong, Yingyu Chen, Jun Tao*, Zhangwen Tang*, “A Synthesizable Constant Tuning Gain Technique for Wideband LC-VCO Design,” IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), 2018.
3. Jun Tao, Zhengqi Gao, Dian Zhou and Xuan Zeng*, “Efficient Statistical Analysis for Correlated Rare Failure Events,” IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT), 2018. (Invited Talk)
4. Jun Tao, Handi Yu, Yangfeng Su, Dian Zhou*, Xuan Zeng* and Xin Li*, "Correlated Rare Failure Analysis via Asymptotic Probability Evaluation," IEEE Design Automation Conference (DAC), 2017.
5. Changhai Liao, Jun Tao*, Handi Yu, Zhangwen Tang, Yangfeng Su, Dian Zhou, Xuan
Zeng*, Xin Li, “Efficient hybrid performance modeling for analog circuits using hierarchical shrinkage priors,” IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), vol. 35, no. 12, pp. 2148-2152, 2016.
6. Handi Yu, Jun Tao*, Changhai Liao, Yangfeng Su, Dian Zhou, Xuan Zeng* and Xin Li, “Efficient statistical analysis for correlated rare failure events via asymptotic probability approximation,” IEEE International Conference on Computer Aided Design (ICCAD), 2016.

 
 
 
 

 

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